JPH032273U - - Google Patents
Info
- Publication number
- JPH032273U JPH032273U JP6314089U JP6314089U JPH032273U JP H032273 U JPH032273 U JP H032273U JP 6314089 U JP6314089 U JP 6314089U JP 6314089 U JP6314089 U JP 6314089U JP H032273 U JPH032273 U JP H032273U
- Authority
- JP
- Japan
- Prior art keywords
- temperature test
- test device
- electrical
- direct heating
- semiconductor device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010438 heat treatment Methods 0.000 claims description 4
- 239000004065 semiconductor Substances 0.000 claims description 3
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6314089U JPH032273U (en]) | 1989-05-29 | 1989-05-29 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6314089U JPH032273U (en]) | 1989-05-29 | 1989-05-29 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH032273U true JPH032273U (en]) | 1991-01-10 |
Family
ID=31592925
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6314089U Pending JPH032273U (en]) | 1989-05-29 | 1989-05-29 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH032273U (en]) |
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1989
- 1989-05-29 JP JP6314089U patent/JPH032273U/ja active Pending